A Study of Technostress among faculty members of HEI’s. Journal of Informatics Education and Research, [S. l.], v. 4, n. 3, 2024. DOI: 10.52783/jier.v4i3.1802. Disponível em: https://jier.org/index.php/journal/article/view/1802. Acesso em: 15 apr. 2026.